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Atomic Scale Analysis of Transition Metal Decorated h-BN via Aberration Corrected Scanning Transmission Electron Microscopy (Cs-STEM)
- Title
- Atomic Scale Analysis of Transition Metal Decorated h-BN via Aberration Corrected Scanning Transmission Electron Microscopy (Cs-STEM)
- Authors
- ODONGO FRANCIS NGOME OKELLO; DOH, KYUNG-YEON; KANG, HYESOO; KIM, YONG TAE; LEE, DONGHWA; CHOI, SI YOUNG
- Date Issued
- 2020-11-03
- Publisher
- THE KOREAN INSTITUTE OF METALS AND MATERIALS
- Article Type
- Conference
- Citation
- The 6th International Conference on Electronic Materials and Nanotechnology for Green Environment, 2020-11-03
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Related Researcher
- 이동화LEE, DONGHWA
- Dept of Materials Science & Enginrg