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dc.contributor.authorODONGO FRANCIS NGOME OKELLO-
dc.contributor.authorDOH, KYUNG-YEON-
dc.contributor.authorKANG, HYESOO-
dc.contributor.authorKIM, YONG TAE-
dc.contributor.authorLEE, DONGHWA-
dc.contributor.authorCHOI, SI YOUNG-
dc.date.accessioned2021-06-01T05:28:10Z-
dc.date.available2021-06-01T05:28:10Z-
dc.date.created2021-04-08-
dc.date.issued2020-11-03-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/105719-
dc.publisherTHE KOREAN INSTITUTE OF METALS AND MATERIALS-
dc.relation.isPartOfThe 6th International Conference on Electronic Materials and Nanotechnology for Green Environment-
dc.titleAtomic Scale Analysis of Transition Metal Decorated h-BN via Aberration Corrected Scanning Transmission Electron Microscopy (Cs-STEM)-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationThe 6th International Conference on Electronic Materials and Nanotechnology for Green Environment-
dc.citation.conferenceDate2020-11-01-
dc.citation.conferencePlaceKO-
dc.citation.titleThe 6th International Conference on Electronic Materials and Nanotechnology for Green Environment-
dc.contributor.affiliatedAuthorODONGO FRANCIS NGOME OKELLO-
dc.contributor.affiliatedAuthorDOH, KYUNG-YEON-
dc.contributor.affiliatedAuthorKANG, HYESOO-
dc.contributor.affiliatedAuthorKIM, YONG TAE-
dc.contributor.affiliatedAuthorLEE, DONGHWA-
dc.contributor.affiliatedAuthorCHOI, SI YOUNG-
dc.description.journalClass2-
dc.description.journalClass2-

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이동화LEE, DONGHWA
Dept of Materials Science & Enginrg
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