Open Access System for Information Sharing

Login Library

OASIS Repository@POSTECHLIBRARY

Browsing by AuthorYOON, GILSANG

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

All 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

or enter first few letters:

Sort by:
In order:
Results/Page
Authors/Record:

Showing results 1 to 7 of 7

Conference

Effect of Interface Roughness on Program/Erase Efficiency for 3D Vertical NAND Flash Memory applications

제27회 한국반도체학술대회, 2020-02

Conference

Effect of Interface Roughness on Program/Erase Efficiency for 3D Vertical NAND Flash Memory applications

한국반도체학술대회, 2020-02

Conference

Effects of Trap Charges in Spacer Region on Retention Variation in 3-D NAND Memory Cells

2021 International Conference on Electronics, Information, and Communication, 2021-02

Conference

Electrical Variations of Non-Circular Cell Structure in 3D NAND Flash Memory Using TCAD-Machine Learning Framework

NANO KOREA 2021, 2021-07

Conference

Investigation of Trap Profiles of Tunneling and Blocking Layers after P/E Cycling Stress in 3-D VNAND Flash Memory

제28회 한국반도체학술대회, 2021-01

Conference

Novel Trap Profiling in Nitride Layer Using Space Program for 3-D NAND Flash Memory

제28회 한국반도체학술대회, 2021-01

Article

single-event upset in 3-D charge-trap NAND flash memoriesSCIESCOPUS

IEEE Transactions on Electron Devices, vol. 69, no. 11, page. 6089 - 6094, 2022-11

1

OAK

개인정보처리방침 Personal Information Protection Policy

library@postech.ac.kr Tel: 054-279-2548

Copyrights © by 2017 Pohang University of Science ad Technology All right reserved.

Browse

Login Library Help