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Effect of Interface Roughness on Program/Erase Efficiency for 3D Vertical NAND Flash Memory applications
- Title
- Effect of Interface Roughness on Program/Erase Efficiency for 3D Vertical NAND Flash Memory applications
- Authors
- LEE, JEONG SOO; JO, YONG JIN; OH, HYEON GWAN; YOON, GILSANG; JIN, JAESEOK; GO, DONGHYUN; PARK, JOUNG HUN
- Date Issued
- 2020-02
- Publisher
- 한국반도체학술대회
- Article Type
- Conference
- Citation
- 제27회 한국반도체학술대회, 2020-02
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Related Researcher
- 이정수LEE, JEONG SOO
- Dept of Electrical Enginrg