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Browsing by  AuthorROH, GIYOUN
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Showing results 1 to 2 of 2
Article
Characterization of positive bias temperature instability concerning interfacial layer thickness of HfSiON/SiO2 nMOSFET
SCIE
SCOPUS
MICROELECTRONICS RELIABILITY, vol. 100-101, 2019-09
ROH, GIYOUN
;
KANG, BONG KOO
;
KIM, HYEOK JIN
Article
Effect of HfSiON thickness on electron trap distributions of HfSiON/SiO2 nMOSFET under PBTI
SCIE
SCOPUS
MICROELECTRONICS RELIABILITY, vol. 100, 2019-09
ROH, GIYOUN
;
KIM, HYEOK JIN
;
Kwon, Y.
;
KANG, BONG KOO
1
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