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JANG, HYUN MYUNG(장현명)
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Div of Advanced Materials Science(첨단재료과학부)
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2001
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BARRIERS
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DAMAGE
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DEVICE
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ELECTRODE
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HYDROGEN-INDUCED DEGRADATION
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MEMORIES
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PB(ZR,TI)O-3
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RECOVERY
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TI)O-3 CAPACITORS
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Article
Degradation mechanism of ferroelectric properties in Pt/Bi4-xLaxTi3O12/Pt capacitors during forming gas annealing
SCIE
SCOPUS
APPLIED PHYSICS LETTERS, vol. 79, no. 15, page. 2450 - 2452, 2001-10-08
Chon, U
;
Kim, KB
;
Jang, HM
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