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Degradation mechanism of ferroelectric properties in Pt/Bi4-xLaxTi3O12/Pt capacitors during forming gas annealing

Title
Degradation mechanism of ferroelectric properties in Pt/Bi4-xLaxTi3O12/Pt capacitors during forming gas annealing
Authors
Chon, UKim, KBJang, HM
POSTECH Authors
Jang, HM
Date Issued
Jan-2001
Publisher
AMER INST PHYSICS
URI
http://oasis.postech.ac.kr/handle/2014.oak/9408
ISSN
0003-6951
Article Type
Article
Citation
APPLIED PHYSICS LETTERS, vol. 79, no. 15, page. 2450 - 2452, 2001-01
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장현명JANG, HYUN MYUNG
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