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JE, JUNG HO(제정호)
scopus
Department
Dept of Materials Science & Engineering(신소재공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2007
1
Type
Article
1
Subject
BOUNDARIES
1
CONTRAST
1
SILICON-CARBIDE
1
SYNCHROTRON-RADIATION
1
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SCIE
1
SCOPUS
1
Applied search limites :
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: scie
Subject
: CONTRAST
Date Issued
: [2000 TO 2009]
Date Issued
: 2007
Journal Papers(International)
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Article
X-ray bright-field imaging analyzes crystalline quality and defects of SiC wafers
SCIE
SCOPUS
JOURNAL OF APPLIED CRYSTALLOGRAPHY, vol. 40, page. 376 - 378, 2007-04
Yi, JM
;
Chu, YS
;
Zhong, Y
;
Je, JH
;
Hwu, Y
;
et al
1
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