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HWANG, HYUNSANG(황현상)
scopus
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Dept of Materials Science & Engineering(신소재공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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2013
1
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Article
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Subject
Defect engineering
1
MEMORY
1
reliability
1
resistive switching
1
retention
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SCIE
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SCOPUS
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Applied search limites :
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: Lee, D
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: scie
Subject
: MEMORY
Subject
: Defect engineering
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Article
Highly reliable resistive switching without an initial forming operation by defect engineering
SCIE
SCOPUS
IEEE Electron Device Letters, vol. 34, no. 12, page. 1515 - 1517, 2013-12
Lee, S
;
Lee, D
;
Woo, J
;
Cha, E
;
Park, J
;
et al
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