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KIM, KWANG JAE(김광재) orcid researcherid scopus

Department: Dept. of Industrial & Management Eng.(산업경영공학과)

Major(s): 품질공정설계 ; 품질공학

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Publication & Time Cited Count (For the Last 5 years)

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Conference

Development of Contrastive Learning-Based Query Strategy to Improve Initial Classification Performance on Class-Imbalanced Wafer Map Defect Pattern

The 23rd Asia Pacific Industrial Engineering and Management Systems, 2023-10-24

Conference

Develoment of Interpretable Quality Predictive Model with Production Log Data Using Multi-modal Transformer Network

The 23rd Asia Pacific Industrial Engineering and Management Systems, 2023-10-24

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Edge Characteristics Metric-Based Under-Sampling for Enhanced Latent Defect Chip Detection Model in Wafer Test

2023 INFORMS Annual Meeting, 2023-10-16

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Explainable Condition Monitoring of Ship’s Main Engine: A Case Study of Overcoming SHAP Limitation through Multicollinearity Removal

Proceedings of The 19th China-Korea Bilateral Symposium on Quality, 2023-08-26

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Edge Characteristics Metric-Based Under-Sampling for Enhanced Latent Defect Detection in Semiconductor Industry

Proceedings of The 19th China-Korea Bilateral Symposium on Quality, 2023-08-26

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Quality prediction in serial-parallel multistage manufacturing process with production log data using deep learning

INFORMS Conference on Quality, Statistics, and Reliability(ICQSR), 2023-06-07

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Suspicious Machine Screening in Serial–Parallel Multistage Manufacturing Process with a Nominal Quality Feature: A Production Log Data-based Approach

2022 INFORMS Annual Meeting, 2022-10-16

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Detecting Abnormal Behavior of Wafer Test Equipment using Auto-encoder with Event Log Data

2022 INFORMS Annual Meeting, 2022-10-16

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User experience evaluation of smart lighting in a living lab

2022 INFORMS Conference on Service Science(ICSS), 2022-07-02

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Suspicious Machine Selection in a Serial-Parallel Multistage Manufacturing Process: Production Log Data-based Approach

2021 INFORMS Annual MeetingVirtual, 2021-10-27

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Determining Diagnostic Priorities for Machines in Serial-Parallel Multistage Manufacturing Process

2021 INFORMS Annual MeetingVirtual, 2021-10-27

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A Study on the Effects of Information Privacy Concerns and Electricity Usage Habits on the Acceptance of Advanced Metering Infrastructure

2021 INFORMS Annual MeetingVirtual, 2021-10-27

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Exploring Factors on Residents’ AMI Acceptance: A Focus on Information Privacy Concerns and Perceived Electricity Usage Habits

Proceedings of The 19th ANQ Congress 2021, Virtual, 2021-10-21

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Production Log Data Analysis for Suspicious Machine Selection in a Serial-Parallel Multistage Manufacturing Process: A Literature Review

The 26th International Conference on Production Research, Virtual,, 2021-07-20

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Development of AMI Acceptance Model Focusing on Information Privacy Concerns and Perceived Bad Electricity Usage Habits

The 31st European Conference on Operational Research,Virtual, 2021-07-13

Conference

Development of a Wafer Bin Map Defect Pattern Classification Scheme: Spatial Element-based Approach

The 20th Asia Pacific Industrial Engineering And Management Systems, 2019-12-04

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Discovering Sequences of Machines causing Wafer Bin Map Failure Patterns in Semiconductor Manufacturing Process

The 20th Asia Pacific Industrial Engineering And Management Systems, 2019-12-03

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Application of Energy Usage Patterns for Reducing Occupants’ Discomfort in an On-campus Apartment Building

The 20th Asia Pacific Industrial Engineering and Management Systems, 2019-12-03

Conference

Evaluation of User Experience Using a Virtual Reality Model: A Case of FOLED Chevron Alignment Sign

The 18th China-Korea Bilateral Symposium on Quality, 2019-08-24

Conference

An Approach to Discover the Suspicious Machine Sequence Patterns in Multi-stage Manufacturing Process

The 18th China-Korea Bilateral Symposium on Quality, 2019-08-24

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