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Edge Characteristics Metric-Based Under-Sampling for Enhanced Latent Defect Detection in Semiconductor Industry
- Title
- Edge Characteristics Metric-Based Under-Sampling for Enhanced Latent Defect Detection in Semiconductor Industry
- Authors
- BAE, YOUNG MOK; KIM, KWANG JAE
- Date Issued
- 2023-08-26
- Publisher
- 한국품질경영학회
- Article Type
- Conference
- Citation
- Proceedings of The 19th China-Korea Bilateral Symposium on Quality, 2023-08-26
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Related Researcher
- 김광재KIM, KWANG JAE
- Dept. of Industrial & Management Eng.