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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2021
1
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Article
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3-D-TCAD
1
3-nm node
1
5-nm node
1
6T-SRAM
1
access time
1
back-end-of-line (BEOL)
1
Capacitance
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drain patterning (SDP)
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Epitaxial growth
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FinFETs (FFs)
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: 5-nm node
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: Capacitance
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: 6T-SRAM
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Article
TCAD-Based Flexible Fin Pitch Design for 3-nm Node 6T-SRAM Using Practical Source/Drain Patterning Scheme
SCIE
SCOPUS
IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 68, no. 3, page. 1031 - 1036, 2021-03
Lee, Junjong
;
Yoon, Jun-Sik
;
Lee, Seunghwan
;
Jeong, Jinsu
;
Baek, Rock-Hyun
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