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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2020
1
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Article
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Capacitance
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dc
1
fin
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Fin field effect transistors
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FinFET
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Fins (heat exchange)
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Fringing capacitance
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nanosheet (NS)
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Nanosheets
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Article
Reduction of Process Variations for Sub-5-nm Node Fin and Nanosheet FETs Using Novel Process Scheme
SCIE
SCOPUS
IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 67, no. 7, page. 2732 - 2737, 2020-07
Yoon, J.-S.
;
Lee, S.
;
Lee, J.
;
Jeong, J.
;
Yun, H.
;
et al
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