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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.0 seconds).
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Date issued
2019
1
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Article
1
Subject
5-nm node
1
bottom oxide
1
FinFETs
1
intrinsic delay
1
punch-through-stopper (PTS)
1
sub-fin leakage
1
total delay
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SCIE
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SCOPUS
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: scopus
Subject
: FinFETs
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: bottom oxide
Subject
: punch-through-stopper (PTS)
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Article
Bottom oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node
SCIE
SCOPUS
IEEE ACCESS, vol. 7, page. 75762 - 75767, 2019-06
Yoon, Jun-Sik
;
Jeong, Jinsu
;
Lee, Seunghwan
;
BAEK, ROCK HYUN
1
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