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BAEK, ROCK HYUN(백록현)
scopus
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
Results 1-1 of 1 (Search time: 0.001 seconds).
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Date issued
2014
1
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Article
1
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SCIE
1
SCOPUS
1
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: [2010 TO 2019]
Subject
: 10 nm
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Article
Investigation of Process-Induced Performance Variability and Optimization of the 10 nm Technology Node Si Bulk FinFETs
SCIE
SCOPUS
SOLID-STATE ELECTRONICS, vol. 96, page. 27 - 33, 2014-06
Baek, RH
;
Kang, CY
;
Sohn, CW
;
Kim, DM
;
Kirsch, P
1
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