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Vth Variation Induced by S/D Mole Fraction and Si/SiGe Intermixing of Si-NSFETs
- Title
- Vth Variation Induced by S/D Mole Fraction and Si/SiGe Intermixing of Si-NSFETs
- Date Issued
- 2019-02-14
- Publisher
- KCS
- Article Type
- Conference
- Citation
- 제26회 한국반도체학술대회 (KCS 2019), 2019-02-14
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Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg