A Suspended Nanogap Formed by Field-induced Atomically Sharp Tips
SCIE
SCOPUS
- Title
- A Suspended Nanogap Formed by Field-induced Atomically Sharp Tips
- Authors
- Jun Hyun Han; Kyung Song; Shankar Radhakrishnan; Oh, SH; Chung Hoon Lee
- Date Issued
- 2012-10-29
- Publisher
- Americal Institute of Physics
- Abstract
- A sub-nanometer scale suspended gap (nanogap) defined by electric field-induced atomically sharp metallic tips is presented. A strong local electric field (>10(9) V/m) across micro/nanomachined tips facing each other causes the metal ion migration in the form of dendrite-like growth at the cathode. The nanogap is fully isolated from the substrate eliminating growth mechanisms that involve substrate interactions. The proposed mechanism of ion transportation is verified using real-time imaging of the metal ion transportation using an in situ biasing in transmission electron microscope (TEM). The configuration of the micro/nanomachined suspended tips allows nanostructure growth of a wide variety of materials including metals, metal-oxides, and polymers. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4764562]
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/9746
- DOI
- 10.1063/1.4764562
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- Applied Physics Letters, vol. 101, no. 18, page. 183106, 2012-10-29
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