Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Defect Analysis in 2D Materials by Aberration-corrected Scanning Transmission Electron Microscopy (STEM)

Title
Defect Analysis in 2D Materials by Aberration-corrected Scanning Transmission Electron Microscopy (STEM)
Authors
CHOI, SI YOUNGODONGO, FRANCIS NGOME OKELLOSEO, SEUNGYOUNGHEO, HOSEOKJO, MOON HO
Date Issued
2018-11-16
Publisher
한국세라믹학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/97282
Article Type
Conference
Citation
2018년도 한국세라믹학회 추계학술대회, 2018-11-16
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

조문호JO, MOON HO
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse