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Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution
- Title
- Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution
- Authors
- Chu, YS; Yi, JM; De Carlo, F; Shen, Q; Lee, WK; Wu, HJ; Wang, CL; Wang, JY; Liu, CJ; Wang, CH; Wu, SR; Chien, CC; Hwu, Y; Tkachuk, A; Yun, W; Feser, M; Liang, KS; Yang, CS; Je, JH; Margaritondo, G
- POSTECH Authors
- Je, JH
- Date Issued
- Jan-2008
- Publisher
- AMER INST PHYSICS
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 92, no. 10, 2008-01
- Files in This Item:
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Related Researcher
- 제정호JE, JUNG HO
- Dept of Materials Science & Enginrg