Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution
SCIE
SCOPUS
- Title
- Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution
- Authors
- Chu, YS; Yi, JM; De Carlo, F; Shen, Q; Lee, WK; Wu, HJ; Wang, CL; Wang, JY; Liu, CJ; Wang, CH; Wu, SR; Chien, CC; Hwu, Y; Tkachuk, A; Yun, W; Feser, M; Liang, KS; Yang, CS; Je, JH; Margaritondo, G
- Date Issued
- 2008-03-10
- Publisher
- AMER INST PHYSICS
- Abstract
- Substantial improvements in the nanofabrication and characteristics of gold Fresnel zone plates yielded unprecedented resolution levels in hard-x-ray microscopy. Tests performed on a variety of specimens with 8-10 keV photons demonstrated a first-order lateral resolution below 40 nm based on the Rayleigh criterion. Combined with the use of a phase contrast technique, this makes it possible to view features in the 30 nm range; good-quality images can be obtained at video rate, down to 50 ms/frame. The important repercussions on materials science, nanotechnology, and the life sciences are discussed. (C) 2008 American Institute of Physics.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/9641
- DOI
- 10.1063/1.2857476
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 92, no. 10, 2008-03-10
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