Design and aberration study of a new miniature energy analyzer with correctors in a scanning electron microscope
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SCOPUS
- Title
- Design and aberration study of a new miniature energy analyzer with correctors in a scanning electron microscope
- Authors
- Noh, Hyeongrae; Cho, Boklae; Kim, Jeehoon; Ogawa, Takashi
- Date Issued
- 2019-02
- Publisher
- ELSEVIER SCIENCE BV
- Abstract
- The authors design a new miniature energy analyzer with a magnetic sector and corrector systems that can be installed in a scanning electron microscope for measurement of electron energy loss spectra. In order to correct the geometrical aberration caused by a magnetic sector field, two new corrector systems are designed using ray tracing simulations. One corrector system, using a simple structure, fully corrects second-order aberration and partially corrects third-order aberration. Another corrector system fully corrects third-order aberration in the x-direction. By aberration correction, energy resolution of similar to 10 meV at an initial angle of 5 mrad can be achieved with either of the two corrector systems. Additionally, we reveal an overall process of aberration correction in ray tracing simulations, which can be a useful guideline for aberration correction. Notably, we have established a new method of aberration correction using a simple matrix equation. Using this method, second-order aberration can be fully corrected both conveniently and rapidly. This study enables us to easily calculate and correct geometrical aberration without solving complicated equations.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/95303
- DOI
- 10.1016/j.nima.2018.11.087
- ISSN
- 0168-9002
- Article Type
- Article
- Citation
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 917, page. 9 - 17, 2019-02
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