Bright-field imaging of lattice distortions using x rays
SCIE
SCOPUS
- Title
- Bright-field imaging of lattice distortions using x rays
- Authors
- Yi, JM; Je, JH; Chu, YS; Zhong, Y; Hwu, Y; Margaritondo, G
- Date Issued
- 2006-08-14
- Publisher
- AMER INST PHYSICS
- Abstract
- Can x rays yield bright-field images of crystalline systems similar to those of transmission electron microscopy? So far, the response was negative, but the authors present here a positive case: bright-field x-ray images carrying information both from diffraction/scattering phenomena and from absorption and phase contrast. Specifically, synchrotron x-ray transmission micrographs simultaneously yielded diffraction-based information on strain effects and information on structural inhomogeneities when (0001) 4H-SiC wafers were set for a strong reflection in the Laue geometry. This approach offers interesting advantages with respect to the separate study of strain and inhomogeneity effects for a variety of crystalline systems. (c) 2006 American Institute of Physics.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/9530
- DOI
- 10.1063/1.2337528
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 89, no. 7, 2006-08-14
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