Heating-compensated constant-temperature tunneling measurements on stacks of Bi2Sr2CaCu2O8+x intrinsic junctions
SCIE
SCOPUS
- Title
- Heating-compensated constant-temperature tunneling measurements on stacks of Bi2Sr2CaCu2O8+x intrinsic junctions
- Authors
- Bae, MH; Choi, JH; Lee, HJ
- Date Issued
- 2005-06-06
- Publisher
- AMER INST PHYSICS
- Abstract
- In highly anisotropic layered cuprates such as Bi2Sr2CaCU2O8+x tunneling measurements on a stack of intrinsic junctions (IJs) in a high-bias range are often susceptible to self-heating. In this study we monitored the temperature variation of a stack ("sample stack") of IJs by measuring the resistance change of a nearby stack of IJs, which was strongly thermal coupled to the sample stack. We then adopted a proportional-integral-derivative scheme incorporated with a substrate-holder heater to compensate the temperature variation. This in situ temperature monitoring and controlling technique allows one to get rid of spurious tunneling effects arising from the self-heating. (c) 2005 American Institute of Physics.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/9495
- DOI
- 10.1063/1.1940731
- ISSN
- 0003-6951
- Article Type
- Article
- Citation
- APPLIED PHYSICS LETTERS, vol. 86, no. 23, page. 232502 - 232502, 2005-06-06
- Files in This Item:
-
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.