Impact of Measurement Noise on Millimeter Wave Beam Alignment Using Beam Subsets
SCIE
SCOPUS
- Title
- Impact of Measurement Noise on Millimeter Wave Beam Alignment Using Beam Subsets
- Authors
- VA, VUTHA; CHOI, JUNIL; HEATH, ROBERT; SHIMIZU, TAKAYUKI; BANSAL, GAURAV
- Date Issued
- 2018-10
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Abstract
- This letter derives bounds on performance degradation due to measurement noise in millimeter wave beam alignment methods that train a subset of beam pairs. The analysis applies the union bound and pairwise beam selection error for a wideband channel. While the analysis is oblivious to the method to select the subset of beam pairs, inverse fingerprinting beam alignment is used as a concrete numerical example. Performance evaluation results for different bandwidths show that a wideband system suffers less from measurement noise with the same training sequence duration.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/93980
- DOI
- 10.1109/LWC.2018.2825326
- ISSN
- 2162-2337
- Article Type
- Article
- Citation
- IEEE WIRELESS COMMUNICATIONS LETTERS, vol. 7, no. 5, page. 784 - 787, 2018-10
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.