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Impact of Measurement Noise on Millimeter Wave Beam Alignment Using Beam Subsets SCIE SCOPUS

Title
Impact of Measurement Noise on Millimeter Wave Beam Alignment Using Beam Subsets
Authors
VA, VUTHACHOI, JUNILHEATH, ROBERTSHIMIZU, TAKAYUKIBANSAL, GAURAV
Date Issued
2018-10
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Abstract
This letter derives bounds on performance degradation due to measurement noise in millimeter wave beam alignment methods that train a subset of beam pairs. The analysis applies the union bound and pairwise beam selection error for a wideband channel. While the analysis is oblivious to the method to select the subset of beam pairs, inverse fingerprinting beam alignment is used as a concrete numerical example. Performance evaluation results for different bandwidths show that a wideband system suffers less from measurement noise with the same training sequence duration.
URI
https://oasis.postech.ac.kr/handle/2014.oak/93980
DOI
10.1109/LWC.2018.2825326
ISSN
2162-2337
Article Type
Article
Citation
IEEE WIRELESS COMMUNICATIONS LETTERS, vol. 7, no. 5, page. 784 - 787, 2018-10
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최준일CHOI, JUNIL
Dept of Electrical Enginrg
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