STRUCTURAL AND ELECTROOPTIC PROPERTIES OF LASER ABLATED BI4TI3O12 THIN-FILMS ON SRTIO3(100) AND SRTIO3(110)

Abstract

Bi4Ti3O12 thin films have been grown by laser ablation on SrTiO3(100) and SrTiO3(110) substrates. Substrate surface orientation is found to be an important growth parameter which determines crystal axis orientation, grain growth behavior, and electro-optic properties of the Bi4Ti3O12 thin films. The films grown on SrTiO3(110) shows a ferroelectric phase transition near 720-degrees-C and a large quadratic electro-optic effect with the effective coefficient 1.1 X 10(-16) m2/v 2.