X-ray imaging and TEM study of micropipes related to their propagation through porous SiC layer/SiC epilayer interface
- Title
- X-ray imaging and TEM study of micropipes related to their propagation through porous SiC layer/SiC epilayer interface
- Authors
- 제정호
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/90461
- Article Type
- Conference
- Citation
- 10th International Conference on Silicon Carbide and Related Materials 2003
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.