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Effect of Postgrowth Annealing Temperature on Structral, Optical and Electrical Properties of ZnO Films Grown on Al2O3 by RF Magnetron Sputtering Technique
- Title
- Effect of Postgrowth Annealing Temperature on Structral, Optical and Electrical Properties of ZnO Films Grown on Al2O3 by RF Magnetron Sputtering Technique
- Authors
- 김선효
- Publisher
- Boston, MA, U.S.A.
- Article Type
- Conference
- Citation
- MRS 2004 FALL MEETING
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- 김선효KIM, SEON HYO
- Ferrous & Energy Materials Technology