Development of Synchrotron Grazing Incidence X-Ray Scattering and Its Applications to Characterize Nanoscale Structures and Properties
- Title
- Development of Synchrotron Grazing Incidence X-Ray Scattering and Its Applications to Characterize Nanoscale Structures and Properties
- Authors
- 이문호
- Publisher
- Pohang Accelerator Laboratory
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/89187
- Article Type
- Conference
- Citation
- The 17th Synchrotron Radiation Users’ Workshop & KOSUA Meeting
- Files in This Item:
- There are no files associated with this item.
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