Quantitative Characterization of Nanostructured Polymer Systems in Supported Thin Films by Synchrotron Grazing Incidence X-Ray Scattering
- Title
- Quantitative Characterization of Nanostructured Polymer Systems in Supported Thin Films by Synchrotron Grazing Incidence X-Ray Scattering
- Authors
- 이문호
- Publisher
- Hyogo, Japan
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/89161
- Article Type
- Conference
- Citation
- Synchrotron Radiation in Polymer Science III (SRPS3), SPring-8
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- There are no files associated with this item.
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