A novel series-resistance extraction method for nano-scaled nMOSFETs considering mobility degradation due to Vbs
- Title
- A novel series-resistance extraction method for nano-scaled nMOSFETs considering mobility degradation due to Vbs
- Authors
- 정윤하
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/88150
- Article Type
- Conference
- Citation
- IEEE Nanotechnology Materials and Devices Conference 2008, page. 206
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