Structural characterization of oxynitride films by synchrotron x-ray reflectivity analysis
- Title
- Structural characterization of oxynitride films by synchrotron x-ray reflectivity analysis
- Authors
- 이문호
- Publisher
- Korea Research Institute of Standards
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/85849
- Article Type
- Conference
- Citation
- Korean Society of Crystals Fall Meeting
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- There are no files associated with this item.
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