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Strain measurement by Synchrotron X-ray Diffraction of InAs quantum dots grown on the InP substrate
- Title
- Strain measurement by Synchrotron X-ray Diffraction of InAs quantum dots grown on the InP substrate
- Authors
- 이종람
- Article Type
- Conference
- Citation
- 13차 방사광 가속기 이용자 발표회
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Related Researcher
- 이종람LEE, JONG LAM
- Dept of Materials Science & Enginrg