Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Electrical Properties of Plasma-Enhanced Atomic Layer Deposition HfO2/HfOxNy/HfO2 Gate Oxide

Title
Electrical Properties of Plasma-Enhanced Atomic Layer Deposition HfO2/HfOxNy/HfO2 Gate Oxide
Authors
김형준
URI
https://oasis.postech.ac.kr/handle/2014.oak/83910
Article Type
Conference
Citation
2008년도 한국재료학회 추계학술발표대회
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

김형준KIM, HYUNGJUN
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse