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Determination of the effective image blurring parameter in the SR proximity x-ray lithography simulation

Title
Determination of the effective image blurring parameter in the SR proximity x-ray lithography simulation
Authors
김오현
Date Issued
1999-11-01
URI
https://oasis.postech.ac.kr/handle/2014.oak/79455
Article Type
Conference
Citation
Extended Abstract of XEL '99, 1999-11-01
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김오현KIM, OHYUN
Dept of Electrical Enginrg
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