Hybrid gate-level 누설 전류 모델의 gate library characterization에 적합한 error metric
- Title
- Hybrid gate-level 누설 전류 모델의 gate library characterization에 적합한 error metric
- Authors
- 김영환; 권현정; 박해성; 김진욱
- Date Issued
- 2015-05-16
- Publisher
- 대한전자공학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/71461
- Article Type
- Conference
- Citation
- 대한전자공학회 SoC 설계연구회학술발표회, 2015-05-16
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.