Multi-state resistance controllability and variability analysis of binary oxide RRAM for ultra-high density memory applications
- Title
- Multi-state resistance controllability and variability analysis of binary oxide RRAM for ultra-high density memory applications
- Authors
- 황현상
- Date Issued
- 2015-02-12
- Publisher
- 한국반도체연구조합
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/71078
- Article Type
- Conference
- Citation
- 제22회 한국반도체학술대회, 2015-02-12
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.