Characterization and Microstructure Analysis of SiOx using Raman Spectroscopy
- Title
- Characterization and Microstructure Analysis of SiOx using Raman Spectroscopy
- Authors
- 강병우; 유선영; 김정한
- Date Issued
- 2015-04-03
- Publisher
- 한국전기화학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/69614
- Article Type
- Conference
- Citation
- 2015년도 한국전기화학회 춘계총회 및 학술발표회, 2015-04-03
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- There are no files associated with this item.
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