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Quantitative 2-D strain mapping of InGaN/GaN nanowire-heterostructure using dark-field inline holography
- Title
- Quantitative 2-D strain mapping of InGaN/GaN nanowire-heterostructure using dark-field inline holography
- Date Issued
- 2014-11-13
- Publisher
- 한국현미경학회
- Article Type
- Conference
- Citation
- 2014 Fall Korean Society of Microscopy Conference, 2014-11-13
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