3D Simulation of NBTI in pMOSFET’s Including Discrete Interface and Oxide Traps Generation
- Title
- 3D Simulation of NBTI in pMOSFET’s Including Discrete Interface and Oxide Traps Generation
- Authors
- 백창기
- Date Issued
- 2010-02-26
- Publisher
- 한국반도체학술대회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/68469
- Article Type
- Conference
- Citation
- 제17회 한국반도체학술대회, 2010-02-26
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- There are no files associated with this item.
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