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Tuning of Energetic barrier at semiconductor/dielectric interface to enhance gate-bias stress stability of organic field-effect transistors
- Title
- Tuning of Energetic barrier at semiconductor/dielectric interface to enhance gate-bias stress stability of organic field-effect transistors
- Date Issued
- 2014-04-10
- Publisher
- 한국고분자학회
- Article Type
- Conference
- Citation
- 한국고분자학회 2014 춘계학술대회, 2014-04-10
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Related Researcher
- 박찬언PARK, CHAN EON
- Dept. of Chemical Enginrg