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Tuning of Energetic barrier at semiconductor/dielectric interface to enhance gate-bias stress stability of organic field-effect transistors
- Title
- Tuning of Energetic barrier at semiconductor/dielectric interface to enhance gate-bias stress stability of organic field-effect transistors
- Date Issued
- 2014-08-19
- Publisher
- SPIE
- Article Type
- Conference
- Citation
- 2014 SPIE Optics and Photonics, 2014-08-19
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Related Researcher
- 박찬언PARK, CHAN EON
- Dept. of Chemical Enginrg