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Analysis of Bias-Stress Effect in Organic Transistors by Decoupling the Charge Traps in Semiconductors and Gate-Dielectrics
- Title
- Analysis of Bias-Stress Effect in Organic Transistors by Decoupling the Charge Traps in Semiconductors and Gate-Dielectrics
- Date Issued
- 2013-04-11
- Publisher
- 한국고분자학회
- Article Type
- Conference
- Citation
- 2013 한국고분자학회 춘계 정기총회 및 연구논문 발표회, 2013-04-11
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Related Researcher
- 조길원CHO, KIL WON
- Dept. of Chemical Enginrg