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Fluorine-rich polymer gate dielectrics for highly stable organic field effect transistors(OFETs) against gate bias stress
- Title
- Fluorine-rich polymer gate dielectrics for highly stable organic field effect transistors(OFETs) against gate bias stress
- Date Issued
- 2013-04-11
- Publisher
- 한국고분자학회
- Article Type
- Conference
- Citation
- 한국고분자학회 2013 춘계학술대회, 2013-04-11
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Related Researcher
- 박찬언PARK, CHAN EON
- Dept. of Chemical Enginrg