DC and Thermal Noise Modeling of 20 nm Double-Gate Junctionless MOSFETs
- Title
- DC and Thermal Noise Modeling of 20 nm Double-Gate Junctionless MOSFETs
- Authors
- 정윤하
- Date Issued
- 2013-06-23
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/65562
- Article Type
- Conference
- Citation
- 22nd International Conference on Noise and Fluctuations, 2013-06-23
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.