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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 강봉구 | - |
| dc.contributor.author | 김철규 | - |
| dc.date.accessioned | 2018-06-18T09:21:34Z | - |
| dc.date.available | 2018-06-18T09:21:34Z | - |
| dc.date.created | 2014-03-04 | - |
| dc.date.issued | 2013-11-07 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/65516 | - |
| dc.publisher | The Japan Society of Applied Physics | - |
| dc.relation.isPartOf | International Workshop on DIELETRIC THIN FILMS FOR FUTURE ELECTRON DEVICES | - |
| dc.title | Saturation Effect for Vth Shift durng the Positive Bias Temperature Instability of HfSiON/SiO2 nMOSFET and Its Impact on Device Life time | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | International Workshop on DIELETRIC THIN FILMS FOR FUTURE ELECTRON DEVICES | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | International Workshop on DIELETRIC THIN FILMS FOR FUTURE ELECTRON DEVICES | - |
| dc.contributor.affiliatedAuthor | 강봉구 | - |
| dc.contributor.affiliatedAuthor | 김철규 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 강봉구KANG, BONG KOO
- Dept of Electrical Enginrg