Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
- Title
- Characterization of Low Frequency Noise in Nanowire FETs Considering Variability and Quantum Effects
- Authors
- 정윤하; 이상현; 이정수
- Date Issued
- 2013-06-24
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/64346
- Article Type
- Conference
- Citation
- Device Research Conference, 2013-06-24
- Files in This Item:
- There are no files associated with this item.
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