Mechanism of Bias Stress Induced Charge Trapping at Polymer Gate-Dielectric in Organic Transistor
- Title
- Mechanism of Bias Stress Induced Charge Trapping at Polymer Gate-Dielectric in Organic Transistor
- Authors
- 조길원; 최현호
- Date Issued
- 2012-04-12
- Publisher
- 한국고분자학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/64004
- Article Type
- Conference
- Citation
- 2012 한국고분자학회 춘계 정기총회 및 연구논문 발표회, 2012-04-12
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- There are no files associated with this item.
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