Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Combined Analyses of STEM and APT for Nano-scale Phase Identification in Advanced Materials and Devices.

Title
Combined Analyses of STEM and APT for Nano-scale Phase Identification in Advanced Materials and Devices.
Authors
박찬경박형석구길호설재복
POSTECH Authors
박찬경
Date Issued
5-Feb-2012
Publisher
APMC
URI
http://oasis.postech.ac.kr/handle/2014.oak/63446
Article Type
Conference
Citation
APMC 2012, 2012-02-05
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

박찬경PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse