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2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
- Title
- 2-D strain and charge density mapping using inline electron holography with a sub-nanometer resolution
- Date Issued
- 2012-11-29
- Publisher
- Materials Research Society
- Article Type
- Conference
- Citation
- 2012 MRS Fall Meeting, 2012-11-29
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Related Researcher
- 오상호OH, SANG HO
- Dept of Materials Science & Enginrg