Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs
- Title
- Intrinsic Reliability Improvement of SiGe Quantum Well pMOSFETs
- Authors
- 정윤하
- Date Issued
- 2012-07-26
- Publisher
- IUPAP
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/61716
- Article Type
- Conference
- Citation
- International Conference on Superlattices, Nanostructures, and Nanodevices, 2012-07-26
- Files in This Item:
- There are no files associated with this item.
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