Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
- Title
- Reliable Extraction of Series Resistance in Silicon Nanowire FETs Using Y-function Technique
- Authors
- 정윤하
- Date Issued
- 2011-10-20
- Publisher
- IEEE
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/61502
- Article Type
- Conference
- Citation
- IEEE Nanotechnology Materials and Devices, 2011-10-20
- Files in This Item:
- There are no files associated with this item.
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